*  Journal of The Royal Society Interface
The energy required to produce the X-ray emission can be provided by electron, proton or photon beams. For imaging at high ... Under these conditions, the sample does not suffer any mass loss and one can access the areal mass of the sample (mass of the ... Backscattering spectrometry. BS is based on the measurement of the energy of backscattered particles after interaction with the ... 4. Chemical element speciation with synchrotron radiation beams. 4.1. X-ray absorption spectroscopy. Hard XAS is element ...
  http://rsif.royalsocietypublishing.org/content/6/Suppl_5/S649.long
*  X-ray spectroscopy - Wikipedia
In a material, the X-rays may suffer an energy loss compared to the incoming beam. This energy loss of the re-emerging beam ... Atoms can be excited by a high-energy beam of charged particles such as electrons (in an electron microscope for example), ... X-ray absorption spectroscopy X-ray magnetic circular dichroism X-Ray Spectrometry (journal) "x ray spectroscopy" (PDF). THE ... Oliver R. Hoidn who came up with a disposable x-ray camera based on mass produced complementary metal-oxide-semiconductor ...
  https://en.wikipedia.org/wiki/X-ray_spectroscopy
*  Handbook of Antistatics - Polypropylene
10.4 UV and electron beam curing 10.5 Plasma treatment 10.6 Physical vapor deposition 10.7 Mixing/dispersion 10.8 ... 17.3.1 Time-of-flight secondary ion mass spectrometry 17.3.2 Atomic force microscopy 17.3.3 Microscopy 17.3.4 X-ray ... 17.3.9 Atomic absorption spectroscopy 17.3.10 Thermal analysis 17.3.11 Molecular mass 17.3.12 Specific surface area 17.3.14 ... 5.2 Types of discharge and discharge energy 5.3 Minimum ignition energy 5.4 Preventive measures References 6 Mechanisms of ...
  http://www.chemtec.org/proddetail.php?prod=1-895198-34-8&cat=68
*  Electron probe micro-analyzer (EPMA)
EPMA is also informally called an electron microprobe, or just ... ... An electron probe micro-analyzer is a microbeam instrument used primarily for the in situ non-destructive chemical analysis of ... the incident electron beam has sufficient energy to liberate both matter and energy from the sample. These electron-sample ... Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) *Integrating Research and Education *Cretaceous ...
  https://serc.carleton.edu/research_education/geochemsheets/techniques/EPMA.html
*  Jawaharlal Nehru Centre for Advanced Scientific Research
V. H. S. Moorthy, V. S. Tomar, A. Das, R.Suryanarayanan and S.M. Shivaprasad, The low electron energy loss spectroscopy (EELS) ... D. N, Study of oxygen plasma treated GaN film using X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry ... Structure and kinetics of electron beam damage in a chemisorbed monolayer : PF3 on Ru (0001, Springer Series in Surface Science ... J. K. N. Sharma, B. R. Chakraborty and S. M. Shivaprasad, Deep level core electron energy loss studies on silicon surface, ...
  http://www.jncasr.ac.in/cpmupub.php?&dept_id=CPMU&empid=338&yeartype=
*  Shivaprasad S. M. - Publication
V. H. S. Moorthy, V. S. Tomar, A. Das, R.Suryanarayanan and S.M. Shivaprasad, The low electron energy loss spectroscopy (EELS) ... D. N, Study of oxygen plasma treated GaN film using X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry ... Structure and kinetics of electron beam damage in a chemisorbed monolayer : PF3 on Ru (0001, Springer Series in Surface Science ... J. K. N. Sharma, B. R. Chakraborty and S. M. Shivaprasad, Deep level core electron energy loss studies on silicon surface, ...
  http://www.jncasr.ac.in/smsprasad/publication.php
*  PhD Thesis | Annett Thøgersen
... electron energy loss spectroscopy, X-ray photoelectron spectroscopy, energy dispersive spectroscopy, and secondary ion-mass ... The exposure of oxide to an electron beam with 1.56 × 106 electrons nm2 s causes nanocluster growth. Initially this growth ... electron energy loss spectroscopy, energy filtered TEM, scanning transmission electron microscopy, and x-ray photoelectron ... electron energy loss spectroscopy, and x-ray photoelectron spectroscopy (XPS). We used XPS data in the form of the Auger ...
  https://annettthogersen.wordpress.com/phd-thesis/
*  Inductively coupled plasma mass spectrometry - Wikipedia
... microspectrophotometry and scanning electron microscopy-energy dispersive spectroscopy (SEM-EDS), and Raman spectroscopy. A ... Before mass separation, a beam of positive ions has to be extracted from the plasma and focused into the mass-analyzer. It is ... thus eliminating the need to change out tanks frequently as well as minimizing loss of argon that is left over in each used ... compared with other types of mass spectrometry, such as thermal ionization mass spectrometry (TIMS) and glow discharge mass ...
  https://en.wikipedia.org/wiki/Inductively_coupled_plasma_mass_spectrometry
*  List of International Organization for Standardization standards - Wikipedia
2015 Practice for dosimetry in an electron beam facility for radiation processing at energies between 300 keV and 25 MeV ISO/ ... smoke production and mass loss rate ISO 5660-1 Heat release rate (cone calorimeter method) ISO 5660-2 Smoke production rate ( ... Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry ... Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative ...
  https://en.wikipedia.org/wiki/List_of_International_Organization_for_Standardization_standards
*  Cesio - Wikipedia, a enciclopedia libre
"Single-atom electron energy loss spectroscopy of light elements". Nature Communications 6: 7943. PMC 4532884. PMID 26228378. ... Rose, M. E. (1987). "Mass Spectrometry". Specialist Periodical Reports 9. Royal Society of Chemistry: 125. ISBN 9780851863382. ... Marrese, C.; Polk, J.; Mueller, J.; Owens, A.; Tajmar, M.; Fink, R.; Spindt, C. (outubro de 2001). In-FEEP Thruster Ion Beam ... International Atomic Energy Agency.. *↑ 142,0 142,1 "El CSN detectó la fuga antes del 9 de junio, pero no informó por ...
  https://gl.wikipedia.org/wiki/Cesio
*  Electron Energy Loss Spectroscopy | Elemental Mapping and Identification | EAG Laboratories
EAG Laboratories uses Electron Energy Loss Spectroscopy (EELS) to provide elemental mapping and identification for a sample on ... Mass Spectrometry. Need to evaluate the molecular structure of a compound or identify its origins? EAG knows how. With state-of ... Electron Energy Loss Spectroscopy (EELS). Electron Energy Loss Spectroscopy (EELS) is a technique that provides elemental ... of Matrix Elements in a Microelectronic Device by Scanning Transmission Electron Microscopy-Electron Energy Loss Spectroscopy ( ...
  https://www.eag.com/electron-energy-loss-spectroscopy-eels/
*  Glossary
high-resolution transmission electron microscopy. HREELS. high-resolution electron energy loss spectroscopy. ... inductively coupled plasma mass spectrometry. ICP-OES. inductively coupled plasma-optical emission spectrometry. ... electron beam induced deposition. EC. electrocatalyst; ethylene carbonate. ECVT. electrical capacitance volume tomography. ... high-resolution scanning electron microscopy. HR-TEM. ... energy-dispersive X-ray spectroscopy. EDX. energy-dispersive X- ...
  http://www.technology.matthey.com/resources/glossary/
*  PVC Degradation and Stabilization - Electronics and electrical
10.5.10 Positron annihilation lifetime spectroscopy, PAS 10.5.11 Raman 10.5.12 Time-of-flight secondary ion mass spectrometry, ... 7.2 b-radiation (electron beam) 7.3 Corona discharge 7.4 Ion (proton) beam 7.5 Laser 7.6 Metallization 7.7 Microwave 7.8 ... 10.2.2 Mass loss 10.3 Combustion 10.4 Optical properties 10.5 Spectroscopic methods 10.5.1 Atomic absorption, AAS 10.5.2 Auger ... 5.1.1 Radiative energy 5.1.2 Radiation intensity 5.1.3 Radiation incidence 5.1.4 Absorption of radiation by materials 5.1.5 ...
  https://www.chemtec.org/proddetail.php?prod=978-1-895198-39-3&cat=38
*  Equipment & Facilities - Bernal Institute
Titan Themis with analytical and spectroscopic facilities for energy dispersive X-ray and electron energy loss spectroscopy ... Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) TOF-SIMS is a very sensitive surface analytical technique. It ... The Bernal Institute has an extensive suite of these instruments, including also a Focused Ion Beam SEM (FIB-SEM) to produce ... X-ray Photoelectron Spectroscopy (XPS) XPS provides information about the elemental and chemical composition of a surface. It ...
  https://bernalinstitute.com/equipment-facilities/
*  JoVE | Peer Reviewed Scientific Video Journal - Methods and Protocols
... resin embedded stained electron tomography, focused ion beam- and serial block face- scanning electron microscopy (FIB-SEM, SBF ... Tandem mass spectrometry is then used to identify the stably co-purifying proteins with high sensitivity (low nanogram ... Dependence of Laser-induced Breakdown Spectroscopy Results on Pulse Energies and Timing Parameters Using Soil Simulants ... Here, the loss of a single gene is buffered, such that either single mutant is viable. However, the loss of both pathways is ...
  https://www.jove.com/visualize/abstract/20467446/building-fe-s-proteins-bacterial-strategies
*  Atom probe - Wikipedia
... which relates kinetic energy to energy gain due to the electric field, the negative arising from the loss of electrons forming ... Through coupling of this magnification method with time of flight mass spectrometry, ions evaporated by application of electric ... Panitz, John A. (1978). "Imaging Atom-Probe Mass Spectroscopy". Progress in Surface Science. 8 (6): 219-263. Bibcode:1978PrSS ... Optionally, an atom probe may also include laser-optical systems for laser beam targeting and pulsing, if using laser- ...
  https://en.wikipedia.org/wiki/Atom_probe
*  Laboratory Testing | Laboratory & Other Services | Practices | Practices & Industries | Exponent
Scanning Electron Microscopes with Energy Dispersive X-ray Spectroscopy (SEM/EDS) *SEMs equipped with a large chambers and EDS ... Gas chromatography-mass spectrometry (GC-MS) and GC-flame ionization detector (GC-FID) *Direct liquid injection and thermal ... Dual beam FE-SEM and Focused Ion Beam (FIB) and EDS - micromanipulator for cross section extraction ... Cross-wire impedance, skew, loss and high speed signal propagation delay with network analyzers; ...
  https://www.exponent.com/services/practices/laboratory-services/laboratory-services
*  US Patent # 5,821,541. Method and apparatus for radiation detection - Patents.com
In one embodiment a silicon Compton recoil electron detector uses the Compton double scatter technique with recoil electron ... The energy loss suffered by the recoil electron at each silicon detector plane is not uniform. The energy loss in each detector ... is shown, where a is defined as the ratio of photon energy E and electron rest mass: a=E/mc.sup.2. For x-ray photon energy from ... The Compton scatter depends strongly on the electron content of the material the x-ray beam traverses. Therefore, the energy ...
  http://patents.com/us-5821541.html
*  Protocols and Video Articles Authored by Manish Jain (Translated to Arabic)
Unlike all other focused ion or electron beam writing techniques, this self-aligned method is virtually unaffected by ... Liquid Chromatography--electrospray Ionisation Mass Spectrometry Method for the Determination of Escitalopram in Human Plasma ... It shows that the FSOI system can achieve significantly lower loss and higher energy efficiency than the WDM system, even with ... the Ti and O components of the rutile TiO2 valence band using the method of site-specific x-ray photoelectron spectroscopy. ...
  https://www.jove.com/author/Manish_Jain?language=Arabic
*  Search Results - - 617 Results - Digital Library
... low energy electron diffraction LEED, electron energy loss spectroscopy (EELS) and Auger electron spectroscopy (AES) ... Mass analysis of lipids extracted from individual cells can be carried out in multiple mass spectrometry platforms through ... Molecular beam epitaxy (MBE) of C yielded few layer graphene in azimuthal registry with BN/Co(0001) substrate. Low energy ... Direct Inject Mass Spectrometry for Illicit Chemistry Detection and Characterization Description: The field of direct inject ...
  https://digital.library.unt.edu/explore/collections/UNTETD/browse/?fq=untl_institution%3AUNT&sort=added_d&fq=str_degree_department%3ADepartment+of+Chemistry
*  JoVE | Peer Reviewed Scientific Video Journal - Methods and Protocols
Chemistry, Issue 88, soft landing, mass selected ions, electrospray, secondary ion mass spectrometry, infrared spectroscopy, ... energy transformation processes in energy storage and conversion devices in general are limited primarily by charge and mass ... We also discuss our protocol for obtaining the spatial and temporal overlap of the signal and pump beams within the Kerr medium ... It is a paroxysmal loss of neuronal function triggered by initially increased neuronal activity, which slowly propagates within ...
  https://www.jove.com/visualize/abstract/25243970/detection-melamine-feed-using-liquid-liquid-extraction-treatment
*  Ion source - Wikipedia
Duoplasmatrons are used for secondary ion mass spectrometry., ion beam etching, and high-energy physics. In a flowing afterglow ... and M is the species that is ionized by the loss of an electron to form the radical cation (indicated by the superscripted " ... "Californium-252 plasma desorption mass spectroscopy". Science. 191 (4230): 920-925. Bibcode:1976Sci...191..920M. doi:10.1126/ ... This technique is similar to secondary ion mass spectrometry and plasma desorption mass spectrometry. Secondary ion mass ...
  https://en.wikipedia.org/wiki/Ion_source
*  Patents filed at May 17 2016 | Method of producing aperture member | Patents.com
The method includes performing electron energy loss spectroscopy (EELS) spectrum imaging for an area... ... In a tandem mass spectrometry system, a first mass analyzer filters parent ions using a wide mass passband with a narrow ... In one embodiment, an aperture member producing method includes applying a charged particle beam to a plurality of chip areas ... Ion trap mass spectrometer. An electrostatic mass spectrometer and a method of mass spectrometric analysis utilizing novel ...
  http://patents.com/isd-20160517-p38.html
*  US Patent # 9,662,644. Magnetic catalyst composition for hydroformylation of olefins - Patents.com
... energy-dispersive X-ray spectroscopy (EDX), matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI ... For scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) analysis the surface morphology of the ... C. Additionally, this weight loss may be entirely due to the loss of water molecules and not signify any loss of bound bis( ... nanoparticles was discerned by a field emission scanning electron microscope (FESEM, LYRA 3 Dual Beam, Tescan) operated at 30 ...
  http://patents.com/us-9662644.html
*  Techniques & Analytical Methods | School of Physics | University of Bristol
The scanning electron microscope uses a focused beam of high energy electrons to create a signal at the surface of solid ... TGA is often combined with a gas analysis instrument; they use infrared spectroscopy, mass spectrometry and gas chromatography ... The output with this method shows temperature on the x-axis and mass loss on the y-axis. To avoid contamination of the sample, ... Spectroscopy/Spectrometry. Laser Raman Spectroscopy (LRS). Instruments available. *Renishaw System 100, 514nm green laser with ...
  http://www.bristol.ac.uk/physics/research/iac/analysis/