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*  Lab Facilities | Chemical Engineering - UC Santa Barbara
... quadrupole mass spectrometry, low-energy electron diffraction, Auger electron spectroscopy, X-ray and UV-photoelectron ... atomic and molecular beam scattering, high-resolution electron energy loss spectroscopy, Fourier transform infrared reflection- ... scanning electron microscopy, atomic force microscopies, as well as dynamic secondary ion mass spectroscopy and x-ray ... NMR Spectroscopy Facilities. State-of-the-art facilities in nuclear magnetic resonance spectroscopy are available in the ...
  https://www.chemengr.ucsb.edu/research/lab-facilities
*  Characterisation of Advanced Materials | University of Surrey - Guildford
... and Auger electron spectroscopy (AES); together with the ion beam techniques of secondary ion mass spectrometry (SIMS) and ... Electron Energy Loss Analysis in the TEM/STEM. *Auger Electron Spectroscopy and Microscopy ... X-ray analysis and vibrational spectroscopies will be described. Surface analysis by electron and ion spectroscopies will also ... X-ray analysis and vibrational spectroscopies will be described. Surface analysis be electron and ion spectroscopies will also ...
  https://www.surrey.ac.uk/department-mechanical-engineering-sciences/short-courses/characterisation-advanced-materials
*  Magnetic lens - Wikipedia
Charged particle beam Electron optics Electron beam technology Ion beam Mass spectrometry Quadrupole ion trap Quadrupole mass ... Electron energy-loss spectroscopy in the electron microscope (2nd ed.). Springer Verlag. ISBN 9780306452239. John M. Rodenburg ... Television sets employing cathode ray tubes use a magnetic lens in the form of a deflection yoke to enable an electron beam to ... and this spiraling expose the electron to H Z {\displaystyle H_{Z}} which in turn focus the electron. Note that the magnetic ...
  https://en.wikipedia.org/wiki/Magnetic_lens
*  Focused ion beam - Wikipedia
TEM or electron energy loss spectroscopy. This damaged layer can be minimized by FIB milling with lower beam voltages, or by ... FIB is also used for Secondary ion mass spectrometry (SIMS). The ejected secondary ions are collected and analyzed after the ... FIB systems operate in a similar fashion to a scanning electron microscope (SEM) except, rather than a beam of electrons and as ... The primary beam also produces secondary electrons (e−). As the primary beam rasters on the sample surface, the signal from the ...
  https://en.wikipedia.org/wiki/Focused_ion_beam
*  UAEU Course Catalog
... and secondary ion mass spectrometry. Electron probe techniques, electron energy loss spectrometry and low-energy electron ... Imaging methods with electron microscopy, scanning probe techniques, x-ray photoelectron spectroscopy and X-ray absorption ... Ion beam techniques, Rutherford backscattering and forward recoil spectrometry, ... Energy management principle, energy auditing process, utility rate structures, economic principles and life cycle cost. Energy ...
  https://www.uaeu.ac.ae/en/catalog/courses/course_2945.shtml?id=MECH513
*  This course aims to introduce students to geometric modeling techniques. Topics include: Freehand sketching, orthographic and...
... and secondary ion mass spectrometry. Electron probe techniques, electron energy loss spectrometry and low-energy electron ... Imaging methods with electron microscopy, scanning probe techniques, x-ray photoelectron spectroscopy and X-ray absorption ... Ion beam techniques, Rutherford backscattering and forward recoil spectrometry, ... Energy management principle, energy auditing process, utility rate structures, economic principles and life cycle cost. Energy ...
  https://www.uaeu.ac.ae/en/catalog/courses/course_2945.shtml?id=MECH315
*  PDF] Download Transmission Electron Microscopy Diffraction Imaging And Spectrometry | Download PDF for Free
Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron ... Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin ... and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy ... reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is ...
  http://clapsbook.com/pdf/transmission-electron-microscopy-diffraction-imaging-and-spectrometry/
*  Spectrum - Wikipedia
... electron energy loss spectroscopy, and mass-analyzed ion-kinetic-energy spectrometry. In physics, particularly in quantum ... the energy spectrum of a particle is the number of particles or intensity of a particle beam as a function of particle energy. ... or decomposed along a continuous variable such as energy in electron spectroscopy or mass-to-charge ratio in mass spectrometry ... The mass spectrum can be used to determine the quantity and mass of atoms and molecules. Tandem mass spectrometry spectra are ...
  https://en.wikipedia.org/wiki/Spectrum
*  Patent US4920168 - Stabilized siloxane-containing melt-extrudable thermoplastic compositions - Google Patents
The energy losses of the scattered helium nuclei give information on the nature and depth of the target atoms in the polymer ... The films from Examples 135 and 159 were subjected to electron spectroscopy for chemical analysis (ESCA). The ESCA data were ... Each sample was gold coated (1--Å thickness) to increase conductivity under the electron beam. ... The winder was a Model 191-W winder and take-away system manufactured by Gloucester Engineering Co., Gloucester, Mass. The ...
  http://www.google.com/patents/US4920168?dq=6322901
*  Permalink
Mass Spectrometry is an essential technique for the structure elucidation of compounds in organic chemistry. Lecture delivered ... In mass spectrometer molecule is vaporized and ionized by bombardment with beam of high energy electrons. When electron beam ... Mass Spectrometry (MS). Mass spectroscopy is the method for determination the molecular mass and formula of the compound and ... in the ionization chamber by heating or bombarded with the beam of high energy electron. At the result the loss of electron ...
  https://chemistry.com.pk/spectroscopy/mass-spectrometry-short-introduction/
*  Frontiers | Formation of Silica-Lysozyme Composites Through Co-Precipitation and Adsorption | Materials
... electron microscopy and potentiometric methods vary dramatically. We document that while lysozyme was not incorporated into nor ... electron microscopy and potentiometric methods vary dramatically. We document that while lysozyme was not incorporated into nor ... electron energy loss spectroscopy (EELS), using a Gatan GIF detector] and energy dispersive spectrometry (using a SiLi detector ... A CeO2 standard was used to calibrate the sample-to-detector distance and to align the detector with the incident beam path. A ...
  https://www.frontiersin.org/articles/10.3389/fmats.2018.00019/full
*  Auger electron spectroscopy - Wikipedia
... electron beam and a carefully tuned bombarding energy (between 1.5 keV and 3 keV). Control of both the angle and energy can ... such as secondary ion mass spectrometry (SIMS), are not applicable to AES, as these methods usually involve surface bombardment ... If plasmon losses have energies near that of an Auger peak, the less intense Auger process may become dwarfed by the plasmon ... such as a photon or a beam of electrons with energies in the range of several eV to 50 keV, a core state electron can be ...
  https://en.wikipedia.org/wiki/Auger_electron_spectroscopy
*  Low temperature thin films formed from nanocrystal precursors - The Regents of the University of California
Electron flux is limited to about 800 e-/A2 sec in the sample plane, well below fluxes commonly required to affect beam induced ... Energy dispersive spectroscopy on particle fields before and after melting shows that the stoichiometry of the sample is ... Preliminary temperature programmed DEI mass spectrometry experiments demonstrated that the surface sites of the thiophenol and ... maintained when the loss of thiols is accounted for. FIGS. 7 and 8 show the changes in diffraction peak intensity as a function ...
  http://www.freepatentsonline.com/5262357.html
*  Society of Vacuum Coaters - On Location Education Program
... static secondary ion mass spectrometry, and high-resolution electron energy loss spectroscopy. Also included is discussion of ... John is currently working as senior scientist and expert for permeation barriers at Fraunhofer Institute for Electron Beam and ... Energy Dispersive Analysis of X-rays (EDAX), X-ray Photoelectron Spectroscopy (XPS, ESCA), Secondary Ion Mass Spectrometry ( ... energy-resolved mass spectroscopy and atomic absorption spectroscopy. Materials characterization includes high-resolution TEM, ...
  https://svc.org/Education/On-Location-Education-Program.cfm
*  Publications | Hoekstra Group | QISD | Zernike (ZIAM) | Onderzoek | Rijksuniversiteit Groningen
Energy loss of highly charged ions on an aluminum surface. Nuclear Instruments & Methods in Physics Research Section B-Beam ... Near-Edge Soft X-ray Absorption Mass Spectrometry of Protonated Melittin. Journal of the American Society for Mass Spectrometry ... Analysis of the fine structure of Sn11+-Sn14+ ions by optical spectroscopy in an electron-beam ion trap. Physical Review A, 94( ... Bodewits, E., Dang, H. M., de Nijs, A. J., Winters, D. F. A., & Hoekstra, R. (2009). Atomic electron energy spectra of slow ...
  https://www.rug.nl/research/zernike/quantum-interactions-and-structural-dynamics/hoekstra-group/publications
*  Electron spectrometer - Wikipedia
Mass spectrometry Electron energy loss spectroscopy Time-of-flight mass spectrometry PEEM Energy filtered transmission electron ... As higher energy electrons will be bent less by the beam, this produces a spatially distributed range of energies. Electron ... All the electrons from an isotopic source may be sucked off and focused into a directed beam (much like in an electron gun), ... In an electron spectrometer, an incoming beam of electrons is bent with electric or magnetic fields. ...
  https://en.wikipedia.org/wiki/Electron_spectrometer
*  Surface Analysis: The Principal Techniques, 2nd Edition | Thin Films' Surfaces & Interfaces | General & Introductory Materials...
7.3 Electron Energy Loss Spectroscopy (EELS) 361. 7.3.1 Inelastic or 'Impact' Scattering 362 ... 4 Molecular Surface Mass Spectrometry by SIMS 113. John C. Vickerman. 4.1 Introduction 113 ... 5.1.3 The Interaction of the Primary Beam with the Sample 214 ... 2 Auger Electron Spectroscopy 9. Hans Jörg Mathieu. 2.1 ... 3 Electron Spectroscopy for Chemical Analysis 47. Buddy D. Ratner and David G. Castner ...
  https://www.wiley.com/en-us/Surface+Analysis%3A+The+Principal+Techniques%2C+2nd+Edition-p-9780470721582
*  Advanced Characterization Center (ACC)
Characteristic X-rays and energy-loss electron that occurs at the same time is used for compositional analysis. The resolution ... Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) is the mass spectrometry of ionized particles which emitted when a ... Surface analysis: Accelerated electron beam or ion beam is used for the analysis what happened in the area corresponding to the ... Raman spectroscopy is observed as inelastically scattered light, allows for the interrogation and identification of vibrational ...
  http://yict.yonsei.ac.kr/eng/res/acc.asp
*  Issue | Solid State Technology
... techniques such as energy-dispersive X-ray (EDX) and electron energy-loss spectroscopy (EELS) are valuable in determining ... Three-dimensional atomic probe tomography (3D-APT) [5] combines field evaporation with time-of-flight mass spectrometry and a ... Multi-Shaped-Beam (MSB): An Evolutionary Approach for High Throughput E-beam Lithography'. Proc. of SPIE Vol. 7823, 78231J-1 ( ... Dopant and carrier metrology for conventional planar devices has been performed primarily using secondary ion mass spectrometry ...
  http://electroiq.com/issue/?id=15892&url=%2Farticles%2Fsst%2Fprint%2Fvolume-55%2Fissue-2%2Ffeatures%2Fmetrology%2Fevolution-or-revolution.html
*  Surface and Thin Film Analysis - A Compendium of Principles, Instrumentation, and Applications - Gernot Friedbacher -...
This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as ... 61 References 64 4 Electron Energy-Loss Spectroscopy (EELS) and Energy-Filtering Transmission Electron Microscopy (EFTEM) 67 ... SIMS 154 8.9 Applications 156 References 159 9 Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS) 161 Michael ... 21.2 Instrumentation 346 21.3 Depth Profiling 348 21.4 Near-Field Ablation 354 21.5 Conclusion 354 References 355 22 Ion Beam ...
  https://www.schweitzer-online.de/ebook/Friedbacher/Surface-Thin-Film-Analysis/9783527636945/A17800690/
*  Elastic recoil detection - Wikipedia
E is the Energy, M is the mass and v is the velocity of the particle beam.and ΔM is reduced mass difference. When an Ion beam ... Equation 7 In elastic spectrometry, the term[S] is called as energy loss factor [S] = K'S(E(x))/Cos θ1 + Sr(K'E(x))2Cos θ2 ... The Fundamental aspects in dealing with recoil spectroscopy involves electron back scattering process of matter such as thin ... 3. Large fraction of energy loss: for fractional energy loss in the region of 0.2< ΔE/E ≤ 0.8, the energy dependence of ...
  https://en.wikipedia.org/wiki/Elastic_recoil_detection
*  Atom - Wikipedia
A more area-selective method is electron energy loss spectroscopy, which measures the energy loss of an electron beam within a ... vaporize atoms include inductively coupled plasma atomic emission spectroscopy and inductively coupled plasma mass spectrometry ... The amount of energy needed to remove or add an electron-the electron binding energy-is far less than the binding energy of ... For this to occur, the electron must drop to a lower energy state that has an energy difference matching the energy of the ...
  https://en.wikipedia.org/wiki/Atom
*  Advanced Laser Technologies 2004 | (2005) | Publications | Spie
Laser spectroscopy and mass spectrometry of biologically relevant systems: chiral discrimination Author(s): Susanna Piccirillo ... The films were analyzed by scanning electron microscopy (SEM), energy dispersion spectroscopy (EDS), Rutherford backscattering ... Moreover, marked differences in the ethyl loss fragmentation energy are observed for the clusters with water and with the two ... Periodic ripples produced by a scanning beam of a femtosecond Ti:sapphire laser Author(s): E. Freysz; S. M. Pershin; G. A. ...
  http://spie.org/Publications/Proceedings/Volume/5850
*  Molecular Foundry
The Molecular Foundry is a Department of Energy-funded nanoscience research facility that provides users from around the world ... local electronic structure measurements by electron energy-loss spectroscopy (Z , 2), convergent beam electron diffraction for ... These include beam current, sample density, sample atomic mass, and incoming ion mass. The main ion species used at NCEM is Ga+ ... Microchemical analysis: Element mapping and energy dispersive X-ray spectrometry (EDS) are available on the NCEM FIB system. ...
  http://foundry.lbl.gov/facilities/ncem/expertise.html
*  Chemical Changes in Layered Ferroelectric Semiconductors Induced by Helium Ion Beam (Journal Article) | DOE PAGES
Atomic-scale chemical mapping by electron dispersive X-ray spectroscopy in STEM indicates the electron-beam-induced SRL ... Here we combine SPM tip induce polarization switching and secondary ion mass spectrometry to explore the evolution of chemical ... Sensitivity of the lithium-rich layered oxides to high-energy electrons leads to the formation of thin, defect spinel layer on ... Capacity loss, and voltage decrease upon electrochemical charge-discharge cycling observed in lithium-rich layered cathode ...
  https://www.osti.gov/pages/biblio/1412062-chemical-changes-layered-ferroelectric-semiconductors-induced-helium-ion-beam