• Ultramicroscopy
  • CS1 maint: Extra text: authors list (link) F. Hofer, P. Warbichler and W. Grogger, Imaging of nanometer-sized precipitates in solids by electron spectroscopic imaging, Ultramicroscopy, Volume 59, Issues 1-4, July 1995, Pages 15-31. (wikipedia.org)
  • LEEM
  • Low-energy electron microscopy, or LEEM, is an analytical surface science technique invented by Ernst Bauer in 1962, however, not fully developed (by Ernst Bauer and Wolfgang Telieps) until 1985. (wikipedia.org)
  • probes
  • The addition of an aberration corrector to STEMs enables electron probes to be focused to sub- ångström diameters, allowing images with sub- ångström resolution to be acquired. (wikipedia.org)
  • Fluctuation electron microscopy (FEM) is a technique in electron microscopy that probes nanometer-scale or "medium-range" order in disordered materials. (wikipedia.org)
  • Standard fluorescent proteins as dual-modality probes for correlative experiments in an integrated light and electron microscope. (wikipedia.org)
  • magnetic
  • In 1858 Plücker observed the deflection of "cathode rays" (electrons) with the use of magnetic fields. (wikipedia.org)
  • The device used two magnetic lenses to achieve higher magnifications, arguably creating the first electron microscope. (wikipedia.org)
  • produces
  • One of today's sharpest imaging tools, super-resolution microscopy, produces sparkling images of what until now has been the blurry interior of cells, detailing not only the cell's internal organs and skeleton, but also providing insights into cells' amazing flexibility. (news-medical.net)
  • detector
  • EsB detector with filtering grid for the detection of energy selective backscattered electrons. (weizmann.ac.il)
  • the E-T detector collects SE2 electrons and provide topographical information, the in-lens detector collects SE1 electrons and provide high resolution surface information, the AsB detector collects BS electrons at voltages higher than 5kV and provide composition and channeling contrast, the CL detector collects photons that can be emitted as a result of electron-hole recombination in semiconductor samples, the EDS collects x-ray signals and provide elemental analysis. (weizmann.ac.il)
  • the new generation E-T detector can filter out SE3 electrons, thus it collects mainly SE2 electrons and provide topographical information, the in-lens Duo detector collects SE1 and BS electrons and provide high resolution surface information together with material information, the HD-AsB provides material and orientational information. (weizmann.ac.il)
  • electrostatic
  • In that same year, Reinhold Rudenberg, the scientific director of the Siemens company, patented an electrostatic lens electron microscope. (wikipedia.org)
  • An electrostatic immersion objective lens brings the sample close to that of the gun, slowing down the high energy electrons to a desired energy only just before interacting with the sample surface. (wikipedia.org)
  • Once sufficient thermal vibrational energy is attained electrons may overcome this electrostatic energy barrier, allowing them to travel into vacuum and accelerate down the lens column to the gun potential (because the lenses are at ground). (wikipedia.org)
  • Nano
  • This technique is used in order to obtain information at different length scales: the electron microscope provides high-resolution information down to the nano-scale, while the fluorescence microscope highlights the regions of interest. (wikipedia.org)
  • The electron microscope is used to obtain structural information at the nano-scale. (wikipedia.org)
  • Graphene liquid cells facilitate electron microscopy studies of nano crystal formation. (wikipedia.org)
  • Theory
  • In 1926 Hans Busch published work extending this theory and showed that the lens maker's equation could, with appropriate assumptions, be applied to electrons. (wikipedia.org)
  • 2016
  • Using advanced correlative microscopy to study complex biological samples in Encyclopedia of Analytical Chemistry", eds R.A. Meyers, John Wiley: Chichester, a9473 (2016) Voorneveld, Philip W., et al. (wikipedia.org)
  • samples
  • The scanning electron dicroscope does produce lower resolution images than the transmission electron microscope, but since it uses surface electron interactions, it can image bulk samples and provide a much greater depth of field. (news-medical.net)
  • Traditionally, samples would be imaged using two separate microscopy modalities, potentially at different facilities and using different sample preparation methods. (wikipedia.org)
  • The exact description of dynamical scattering of electrons in a sample not satisfying the weak phase object approximation (WPOA), which is almost all real samples, still remains the holy grail of electron microscopy. (wikipedia.org)
  • Samples are prepared by methods similar to that in transmission electron microscopy (TEM), typically by fixing the sample with aldehyde, staining with heavy metals such as osmium and uranium then embedding in an epoxy resin. (wikipedia.org)
  • structural
  • A significant improvement in structural features was achieved in 2012 by the introduction of direct electron detectors and better computational algorithms. (wikipedia.org)
  • sample
  • A wide spectrum of electrons is emitted with energies between the energy of the illumination and the work function of the sample. (wikipedia.org)
  • A version of electron cryomicroscopy is cryo-electron tomography (CET), where a 3D reconstruction of a sample is created from tilted 2D images. (wikipedia.org)
  • Alternate modes of use allow for the TEM to observe modulations in chemical identity, crystal orientation, electronic structure and sample induced electron phase shift as well as the regular absorption based imaging. (wikipedia.org)
  • The "fast" electrons travel through an objective lens and begin decelerating to low energies (1-100 eV) near the sample surface because the sample is held at a potential near that of the gun. (wikipedia.org)
  • The low-energy electrons are now termed "surface-sensitive" and the near-surface sampling depth can be varied by tuning the energy of the incident electrons (difference between the sample and gun potentials minus the work functions of the sample and system). (wikipedia.org)
  • Cryo-scanning electron microscopy (CSEM) is a form of electron microscopy where a hydrated but cryogenically fixed sample is imaged on a scanning electron microscope's cold stage in a cryogenic chamber. (wikipedia.org)
  • However, a large part of the structure information of the sample is contained in the phase of the electron wave. (wikipedia.org)
  • Each imaging electron interacts independently with the sample. (wikipedia.org)
  • Above the sample, the wave of an electron can be approximated as a plane wave incident on the sample surface. (wikipedia.org)
  • The surface of the block of resin-embedded sample is imaged by detection of back-scattered electrons. (wikipedia.org)
  • differential
  • At lower magnifications TEM image contrast is due to differential absorption of electrons by the material due to differences in composition or thickness of the material. (wikipedia.org)
  • Therefore, electron microscopy in conjunction with differential heavy atom DNA labeling could be used to directly image the DNA in order to determine its sequence. (wikipedia.org)
  • dense
  • The ultrathin sections are collected on 3mm copper (mesh) grids and stained with uranyl acetate and lead citrate to make the contents of the tissue electron dense (and thus visible in the electron microscope). (wikipedia.org)