• specimen
  • Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. (springer.com)
  • But there are additional benefits which arise from using electron beams rather than light beams in image formation since the interaction of electrons with solids is more diverse than that of photons, and correct use of the sem can yield much more information-for example, on crystal orientation, chemical composition, magnetic structure or electric potential in the specimen. (springer.com)
  • and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions. (spie.org)
  • Unlike an electron microscope, FIB is inherently destructive to the specimen. (wikipedia.org)
  • Analyzing the electrons detected by the SEM, he reported that about 67% of the signal measured could be attributed to low energy secondaries from the specimen. (wikipedia.org)
  • STEM
  • However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 - 0.2 nm) which is then scanned over the sample in a raster. (wikipedia.org)
  • Crewe and coworkers at the University of Chicago developed the cold field emission electron source and built a STEM able to visualize single heavy atoms on thin carbon substrates. (wikipedia.org)
  • atomic
  • Commercially available nanoprobing systems are integrated into either a vacuum-based scanning electron microscope (SEM) or atomic force microscope (AFM). (wikipedia.org)
  • An annular dark field image formed only by very high angle, incoherently scattered electrons (Rutherford scattered from the nucleus of the atoms) - as opposed to Bragg scattered electrons - is highly sensitive to variations in the atomic number of atoms in the sample (Z-contrast images). (wikipedia.org)
  • Here "immediately" means that the final electron position is far from the surface on the atomic scale, but still too close to the solid to be influenced by ambient electric fields in the vacuum. (wikipedia.org)
  • wavelength
  • In 1925, Louis de Broglie first theorized the wave-like properties of an electron, with a wavelength substantially smaller than visible light. (wikipedia.org)
  • This image subtends an angular range of over 10° and required use of a shorter than usual camera length L. The Kikuchi band widths themselves (roughly λL/d where λ/d is approximately twice the Bragg angle for the corresponding plane) are well under 1°, because the wavelength λ of electrons (about 1.97 picometres in this case) is much less than the lattice plane d-spacing itself. (wikipedia.org)
  • conventional
  • While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. (spie.org)
  • beam exposure
  • Normally, the insulating materials become charged upon electron beam exposure, making them appear relatively bright when imaged by the electron microscope. (bepress.com)
  • AFM based nanoprobers enable nanometer scale device defect localization and accurate transistor device characterization without the physical damage and electrical bias induced by high energy electron beam exposure. (wikipedia.org)
  • structures
  • Since synapses are small structures, they can only be analyzed using electron microscopy (EM), and thus, the three-dimensional organization of synaptic connections requires electron microscopic examination in order to reveal the design of the local neural circuit. (frontiersin.org)
  • We report a simple method by which 1D conducting structures with sub-micron diameters can be detected in a scanning electron microscope at magnifications more than an order of magnitude less than would be expected for their size. (bepress.com)
  • instrumentation
  • In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. (springer.com)
  • Optics
  • However, in SCEM, the collection optics is arranged symmetrically to the illumination optics to gather only the electrons that pass the beam focus. (wikipedia.org)
  • diameters
  • The addition of an aberration corrector to STEMs enables electron probes to be focused to sub- ångström diameters, allowing images with sub- ångström resolution to be acquired. (wikipedia.org)
  • physics
  • In solid-state physics, the work function (sometimes spelled workfunction) is the minimum thermodynamic work (i.e. energy) needed to remove an electron from a solid to a point in the vacuum immediately outside the solid surface. (wikipedia.org)