• specimen
  • Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. (springer.com)
  • But there are additional benefits which arise from using electron beams rather than light beams in image formation since the interaction of electrons with solids is more diverse than that of photons, and correct use of the sem can yield much more information-for example, on crystal orientation, chemical composition, magnetic structure or electric potential in the specimen. (springer.com)
  • and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions. (spie.org)
  • Analyzing the electrons detected by the SEM, he reported that about 67% of the signal measured could be attributed to low energy secondaries from the specimen. (wikipedia.org)
  • wavelength
  • In 1925, Louis de Broglie first theorized the wave-like properties of an electron, with a wavelength substantially smaller than visible light. (wikipedia.org)
  • This image subtends an angular range of over 10° and required use of a shorter than usual camera length L. The Kikuchi band widths themselves (roughly λL/d where λ/d is approximately twice the Bragg angle for the corresponding plane) are well under 1°, because the wavelength λ of electrons (about 1.97 picometres in this case) is much less than the lattice plane d-spacing itself. (wikipedia.org)
  • conventional
  • While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. (spie.org)
  • atomic
  • An annular dark field image formed only by very high angle, incoherently scattered electrons (Rutherford scattered from the nucleus of the atoms) - as opposed to Bragg scattered electrons - is highly sensitive to variations in the atomic number of atoms in the sample (Z-contrast images). (wikipedia.org)
  • beam exposure
  • AFM based nanoprobers enable nanometer scale device defect localization and accurate transistor device characterization without the physical damage and electrical bias induced by high energy electron beam exposure. (wikipedia.org)
  • instrumentation
  • In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. (springer.com)
  • Optics
  • However, in SCEM, the collection optics is arranged symmetrically to the illumination optics to gather only the electrons that pass the beam focus. (wikipedia.org)
  • diameters
  • The addition of an aberration corrector to STEMs enables electron probes to be focused to sub- ångström diameters, allowing images with sub- ångström resolution to be acquired. (wikipedia.org)
  • Materials
  • Experimental and theoretical maps of Kikuchi band geometry, as well as their direct-space analogs e.g. bend contours, electron channeling patterns, and fringe visibility maps are increasingly useful tools in electron microscopy of crystalline and nanocrystalline materials. (wikipedia.org)