• secondary ion mass spe
  • It was found that time-of-flight secondary ion mass spectrometry is a potential tool for differentiating of acellular bacterial from eukaryotic footprints (i.e. extracellular polymeric substance and extracellular matrix produced by the respective cells) and may have potential for the post-hoc diagnosis of colonisation, biofilm formation and implant-related infections even in culture negative cases. (aalto.fi)
  • Hochschulschriften / Application of secondary ion mass spectrometry. (tuwien.ac.at)
  • Application of secondary ion mass spectrometry (SIMS) in the development of new materials / Martin Rosner. (tuwien.ac.at)
  • In particular, time-of-flight secondary ion mass spectrometry (ToF-SIMS) with its high spatial and depth resolution is becoming part of the imaging mass spectrometry toolbox used for single cell analysis. (mdpi.com)
  • Jungnickel H, Laux P, Luch A. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level. (mdpi.com)