A secondary ion mass spectrometer consists of (1) a primary ion gun generating the primary ion beam, (2) a primary ion column, ... Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by ... The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or ... high vacuum sample chamber holding the sample and the secondary ion extraction lens, (4) a mass analyser separating the ions ...

... , or static SIMS is a secondary ion mass spectrometry technique for chemical analysis ... In SIMS it is these secondary ions which are detected and analyzed by a mass spectrometer to produce a mass spectrum of a ... Secondary ion current: Ii± = Ipfi± CiSiηi (± refers to a positive or negative particle) Ip= Incident ion current (ions/s); fi ... This is because the mass spectrum includes cluster ions as well as elemental ions. These cluster ions reflect the surface ...

"Biological explorations with nanoscale secondary ion mass spectrometry". Journal of Analytical Atomic Spectrometry. 34 (8): ... NanoSIMS (nanoscale secondary ion mass spectrometry) is an analytical instrument manufactured by CAMECA which operates on the ... Kilburn, Matt R.; Wacey, David (2014). CHAPTER 1 Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS) as an Analytical Tool in ... These become secondary ions, which are then detected after transfer through the mass spectrometer. Each primary ion generates a ...

Most common ionization technologies in the field of MSI are DESI imaging, MALDI imaging, secondary ion mass spectrometry ... Section 2.1, Secondary Ion Mass Specctrometry". In Banci, Lucia (ed.). Metallomics and the Cell. Metal Ions in Life Sciences. ... Mass spectrometry imaging (MSI) is a technique used in mass spectrometry to visualize the spatial distribution of molecules, as ... Secondary ion mass spectrometry (SIMS) is used to analyze solid surfaces and thin films by sputtering the surface with a ...

Williams, P. (2011). "Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry". Microscopy and Microanalysis. 17 ... Castaing, Raimond; Slodzian, Georges (2021). "Microanalysis using secondary ion emission". Journal of Mass Spectrometry. 56 (12 ... In the late 1950s he was also involved in the development of secondary ion mass spectrometry (SIMS) (with his student Georges ... Mass spectrometrists, 20th-century French physicists, École Normale Supérieure alumni, University of Paris alumni, French ...

"Static Secondary Ion Mass Spectrometry: (S-SIMS) Part 1. Methodology and Structural Interpretation". Mass Spectrometry Reviews ... Zenobi, Renato; Knochenmuss, Richard (1998). "Ion formation in MALDI mass spectrometry". Mass Spectrometry Reviews. 17 (5): 337 ... Secondary ion mass spectrometry (SIMS) is a method very similar to FAB in that a beam of particles is fired against the surface ... "Gas-phase fast-atom bombardment mass spectrometry". International Journal of Mass Spectrometry and Ion Processes. 152 (1): 1-20 ...

Ion microscopy and secondary ion mass spectrometry; Nonimaging optics and solar energy concentration; Geochemistry, ...

This technique is similar to secondary ion mass spectrometry and plasma desorption mass spectrometry. Secondary ion mass ... Duoplasmatrons can produce positive or negative ions. Duoplasmatrons are used for secondary ion mass spectrometry., ion beam ... Coath, C. D.; Long, J. V. P. (1995). "A high-brightness duoplasmatron ion source for microprobe secondary-ion mass spectrometry ... An ion source is a device that creates atomic and molecular ions. Ion sources are used to form ions for mass spectrometers, ...

In particular, she developed nanoscale secondary ion mass spectrometry.[citation needed] Pett-Ridge has investigated whether it ...

Quantitative Secondary Ion Mass Spectrometry (SIMS) of prehistoric teeth. SIMS 5, Springer: Berlin-New York 1985, 438-442. P.M ... Secondary ion mass spectrometry in the study of biomineralizations and biomaterials. Analytica Chimica Acta 1990, 299-314. P.M ... Recent applications of secondary ion mass spectrometry in archaeology. Archaeometry, Abstracts. Heidelberg 1990. A.R.E. Lodding ... Trace element and dating studies of teeth by Secondary Ion Mass Spectrometry (SIMS). Archaeometry, ed. Y.Maniatis, Elsevier: ...

... high resolution ion microprobe" (PDF). Proceedings of the International Secondary Ion Mass Spectrometry Conference. Springer- ... also sensitive high mass-resolution ion microprobe or SHRIMP) is a large-diameter, double-focusing secondary ion mass ... "Double focusing mass spectrometers of second order", International Journal of Mass Spectrometry and Ion Physics, 14 (2): 219- ... "In-situ microanalysis for 34S/32S ratios using the ion microprobe SHRIMP", International Journal of Mass Spectrometry and Ion ...

FIB is also used for secondary ion mass spectrometry (SIMS). The ejected secondary ions are collected and analyzed after the ... FIB secondary ion images also reveal chemical differences, and are especially useful in corrosion studies, as secondary ion ... extract it and prepare it for analysis using a Secondary ion mass spectrometry (SIMS). The drawbacks to FIB sample preparation ... using secondary electrons and secondary ions, both produced by the primary ion beam, offer many advantages over SEM. FIB ...

1 August 1993). "Quantification of lithium, beryllium, and boron in silicates by secondary-ion mass spectrometry using ... 2013 AN ION PROBE CONTRIBUTION TO RARE-EARTH ELEMENT INVESTIGATION OF GABBRO GOG-1 USING SECONDARY ION MASS-SPECTROMETRY ... the only one National Laboratory of Secondary Ion Mass Spectrometry (SIMS) in the Earth Sciences. Since that time she has been ... "Determination of hydrogen in silicates by secondary ion mass spectrometry". Analyst. 120 (5): 1309. Bibcode:1995Ana...120.1309O ...

Wu, C.; Siems, W. F.; Hill, H. H. (2000-01-15). "Secondary electrospray ionization ion mobility spectrometry/mass spectrometry ... proton-transfer-reaction mass spectrometry and selected-ion flow-tube mass spectrometry. The main feature of SESI is that it ... SESI works in combination with mass spectrometry or ion-mobility spectrometry. The fact that trace concentrations of gases in ... Tam, Maggie; Hill, Herbert H. (2004). "Secondary Electrospray Ionization-Ion Mobility Spectrometry for Explosive Vapor ...

"Secondary electrospray ionization-mass spectrometry: breath study on a control group". Journal of Breath Research. 5 (1): ... "Selected ion flow tube mass spectrometry (SIFT-MS) for on-line trace gas analysis" Smith D., Španěl P.; Mass Spectrometry ... "Selected ion flow tube mass spectrometry (SIFT-MS) for on-line trace gas analysis" Smith D., Španěl P.; Mass Spectrometry ... Selected-ion flow-tube mass spectrometry (SIFT-MS) is a quantitative mass spectrometry technique for trace gas analysis which ...

Fichtner, M.; Lipp, M.; Goschnick, J.; Ache, H. J. (1991-03-01). "Mass spectrometry of secondary neutrals and ions for chemical ... Pioneering achievements were the first measurements of salts with Secondary Neutral Mass Spectrometry, the development of a ... Moreover, a new class of cathode materials is being studied with the highest packing densities for Li ions to date, the so- ... Zhao, Xiangyu; Ren, Shuhua; Bruns, Michael; Fichtner, Maximilian (2014-01-01). "Chloride ion battery: A new member in the ...

The use of Secondary ion mass spectrometry (SIMS) in the measurement of obsidian hydration dating was introduced by two ... Riciputi, L. R.; J. M. Elam; L. M. Anovitz; D. R. Cole (2002). "Obsidian diffusion dating by secondary ion mass spectrometry: A ... In case of measuring the hydration rim using the depth profiling ability of the secondary ion mass spectrometry technique, the ... Liritzis, I.; Diakostamatiou.M (2002). "Towards a new method of obsidian hydration dating with secondary ion mass spectrometry ...

Geobiological investigations using secondary ion mass spectrometry: microanalysis of extant and paleo-microbial processes. ...

Identification of these grains involved a measurement technique called secondary ion mass spectrometry (SIMS). Zinner and ... International Journal of Mass Spectrometry and Ion Processes. 69 (1): 17-38. Bibcode:1986IJMSI..69...17Z. doi:10.1016/0168-1176 ... Since 1974, Zinner's research has involved Ion microprobe analysis. He has worked with the Cameca IMS 3f instrument since 1982 ... Zinner, Ernst; Crozaz, Ghislaine (1986-02-17). "A method for the quantitative measurement of rare earth elements in the ion ...

"Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): ... "Ultrasensitive probing of the protein resistance of PEG surfaces by secondary ion mass spectrometry". Biomaterials. 23 (24): ...

1999). "Secondary ion mass spectrometry study of space-charge formation in thermally poled fused silica". Journal of Applied ... This creates a region a few micrometers thick of high electrical resistivity depleted of positive ions near the anodic surface ...

For this, the chemical composition of the zircons is measured using secondary ion mass spectrometry. The sample is bombarded ... with a beam of primary ions, and the charge and mass of the ejected secondary ions are measured to determine the chemical ... Ti4+, a tetravalent ion, can replace Zr4+ or Si4+ in a temperature dependent mechanism. For zircons in the presence of TiO2, i. ... The final step involves measuring the abundance of titanium in a specific location on a zircon crystal with an ion microprobe. ...

... was a German physicist and mass spectrometry researcher known for his work on static secondary ion mass spectrometry. ... He worked on static secondary ion mass spectrometry (SIMS) and its applications, and developed SIMS instruments. In 1989 he co- ... for the development of concepts and instrumentation in static secondary ion mass spectrometry and the demonstration of its ... Jane Gale, P. (2015). "Alfred Benninghoven". The Encyclopedia of Mass Spectrometry. pp. 15-16. doi:10.1016/B978-0-08-100379- ...

To probe the bulk structure of the thin films, Moons uses dynamic secondary ion mass spectrometry. In 2018, Moons was elected ...

... is also used as a source of positive ions in secondary ion mass spectrometry (SIMS). Since 1967, the International ... The isotopes with mass numbers of 129, 131, 132 and 136, have half-lives between a day and two weeks, while most of the other ... The caesium ion is also larger and less "hard" than those of the lighter alkali metals. Most caesium compounds contain the ... Caesium fluoride enjoys a niche use in organic chemistry as a base and as an anhydrous source of fluoride ion. Caesium salts ...

The sputtered, secondary ions are directed onto the mass spectrometry system to be measured. The secondary ions are a result of ... The ions then enter the mass spectrometer where they are discriminated based on mass based on a double focusing system. Ions of ... "Improved particle location and isotopic screening measurements of sub-micron sized particles by Secondary Ion Mass Spectrometry ... Mass spec can provide elemental and isotopic information. Mass spec also requires less sample mass relative to counting ...

"High Mass Resolution Breath Analysis using Secondary Electrospray Ionization Mass Spectrometry Assisted by an Ion Funnel". ... in mass spectrometry, an ion funnel is a device used to focus a beam of ions using a series of stacked ring electrodes with ... Proton transfer reaction mass spectrometry has traditionally used drift tubes as ion traps. However, radio frequency ion ... "A novel ion funnel for focusing ions at elevated pressure using electrospray ionization mass spectrometry". Rapid ...

... from the southwestern Baltic Sea using secondary ion mass spectrometry". Marine Biology. 168 (8): 133. doi:10.1007/s00227-021- ... It can be found along the Atlantic coast of North America, ranging from Greenland to Massachusetts. Distribution: A. Borealis ...

Reactive ions are frequently used in secondary ion mass spectrometry (SIMS) equipment to enhance the sputter rates. The ... One such example occurs in secondary ion mass spectrometry (SIMS), where the target sample is sputtered at a constant rate. As ... These ions, known as "incident ions", set off collision cascades in the target. Such cascades can take many paths; some recoil ... The ions that cause sputtering come from a variety of sources-they can come from plasma, specially constructed ion sources, ...

Additionally, time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used in combination with GC-MS with samples ... in Cryptomeria japonica heartwood by time-of-flight secondary ion mass spectrometry". Planta. 221 (4): 549-556. doi:10.1007/ ... The aromatic fractions are then analyzed using gas chromatography-mass spectrometry (GC-MS), and library data along with ...