Wael Alsaedi | IntechOpen
Powder X-ray diffraction (XRD), transmission electron microscopy (TEM) and electron paramagnetic resonance (EPR) provided ...
Rogelio Schougall | IntechOpen
... as well as by transmission electron microscopy. Isolation and culture of strains S. mutans and L. casei were done to perform ... using a scanning electron microscope (SEM). The characterization of Ag-NPs in terms of shape, size, and polydispersity was ...
Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes | IntechOpen
... using scanning probe microscopy (SPM). This chapter also presents the features and difficulties of characterization of VA CNTs ... The structural analysis of the VA CNT arrays was conducted by the transmission electron microscopy (TEM) using Tecnai Osiris ( ... Atomic-force Microscopy and Its Applica... Edited by Tomasz Arkadiusz Tański. Atomic-force Microscopy and Its Applications. ... Scanning probe microscopy is a precision method for studying the electrical properties of horizontal carbon nanotubes [33, 34, ...
Forensic Potential of Atomic Force Microscopy with Special Focus on Age Determination of Bloodstains | IntechOpen
... the atomic force microscopy (AFM) imaging technique can be of value. However, it is the force spectroscopy that could make AFM ... high-resolution transmission and scanning electron microscopy (HRTEM, HRSEM) and atomic force microscopy (AFM) are available ... Atomic-force Microscopy and Its Applica... Edited by Tomasz Arkadiusz Tański. Atomic-force Microscopy and Its Applications. ... Three-dimensional imaging and analysis of the surface of hair fibres using scanning electron microscopy. International Journal ...
Ultrasonic Processing of Si and SiGe for Photovoltaic Applications | IntechOpen
a) Cross-sectional scanning electron microscope (SEM) image of a GexSi1-x on Si layer covered with a 10 nm thick a-Si (sample B ... This yields the optical transmission spectra indicative of organic contaminants, which are marked by several peaks in spectra 2 ... b) and (c) distributions of Si and Ge atoms near the interface mapped using a scanning auger microscopy technique. Reproduced ...