• Below are images taken by our research laboratories using our JSM 6510LV demonstrating the use of the secondary electron and back scatter electron detectors at high vacuum, as well as flash freezing specimens with the Jeol cryo-puck. (haverford.edu)
  • The main principle underpinning these imaging techniques is that the detectors are designed such that they mostly collect high-angle scattered electrons, thus minimizing the contribution of elastically scattered electrons to the image. (merlot.org)
  • In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. (springer.com)
  • While secondary elecontrons have an energy lower than 50 eV, backscattered electrons show much higher energies.The different electrons are therefore detected by two different, energy selective detectors which convert them into signals, amplifys and visualizes them on a monitor. (hzdr.de)
  • The main method used to minimize the risk of infection is the use of extremely low numbers of cells-for microscopy only very small numbers of individual cells are required. (springer.com)
  • Light sheet fluorescence microscopy (LSFM) with its unique illumination principle allows fast and gentle imaging of whole living model organisms, tissues, and developing cells. (zeiss.com)
  • Conductive modes of atomic force microscopy are widely used to characterize the electronic properties of materials, and in such measurements, contact size is typically determined from current flow. (americanelements.com)
  • The college already has a room planned in its rising $118 million Sciences and Engineering Innovation Corridor for the new JEOL (Japanese Electron Optical Lab) JSM-6610LV. (microscopy-news.com)
  • To create a SEM image a focused primary electron beam scans across a sample surface. (hzdr.de)
  • Here, the FE properties, in accordance with the tip-sample separation, will be emphasized, since the variations in SE yield are directly proportional to the impinging primary electron beam. (logos-verlag.de)
  • Here, we describe how three dimensional (3D) reconstruction analysis from the serial block-face scanning electron microscopy (SBFSEM) can be used to gain insights on the morphological and volumetric analysis of this critical energy generating organelle. (jove.com)